WIPS Global ADVANCED

From Intellogist

Jump to: navigation, search
If you found this page through a web search, we invite you to visit our Main Page to see what Intellogist is all about. This Community Report exists for our users to share information and experiences about patent search resources. Registered users can add, edit, or delete material on this page. The information contained on this page is the result of community collaboration and is not vetted by individual experts or fact-checkers. For in-depth reviews of other patent search resources, please read our Intellogist Reports. For information about editing Community reports, please see our Help pages. If you'd like more information about why Intellogist did not write about this search tool, please see our Criteria for Intellogist Articles.

Introduction

WIPS Global ADVANCED is a new patent search and analysis service provided by WIPS Co.,Ltd., the producers of WIPS Global. The service was launched February 1, 2012, and it will replace the WIPS 4.0 service by March 31, 2013.[1] Unique features of WIPS Global ADVANCED include:[2]

  • Search services
    • Error checking for queries (including using past queries to check the current query)
    • Search based on family information, citation information, or company information
    • Patent classification tags - users can classify results according to their relevance
    • Patent classification code table which includes IPC, UPC, FI/F-term and ECLA at a glance
  • Analysis services
    • A structural visualization of the differentiation of attributed claims
    • Citation relationship and visual mode
    • Compare between claims and bibliographic data of family documents
    • Visualization of statistical analysis data.
  • Alerts and Personalization
    • Extended SDI service
    • Personalization options for search/output


Major Recent Updates

December 2012 - The "News and Notices" section of the WIPS Global ADVANCED website states that six new countries have been added to the service.[3] The coverage section of the WIPS Global ADVANCED website lists the following new coverage for six countries:[4]

Data collection Coverage Data Update
frequency
Others DE From 1861.09.28 Bibliography, Abstract, Claims, Description, Rep Drawings Every month
GB From 1855.02.27 Bibliography, Abstract, Claims, Description, Rep Drawings Every month
FR From 1978.07.04 Bibliography, Abstract, Claims, Description, Rep Drawings Every month
RU From 1975.08.02 Bibliography, Abstract, Claims, Description, Rep Drawings Every month
IN From 1993.02.15 Bibliography, Abstract, Rep Drawings Every month
TW From 1991.01.21 Bibliography, Abstract Every month


December 2012 - The "News and Notices" section of the WIPS Global ADVANCED website states that "file contents history (EPO)" links are now accessible through the system.[3] This most likely indicates that EP records on this system now link to the EPO Register.

August 2012 - According to an announcement on the WIPS Global website:[5]

We’re preparing IDC (Internet Data Center) transfer to provide more secure & stable service. Service Improvements from IDC Transfer:
  • Speed up using information : Smooth and reliable service in soaring traffic
  • Enhance security for personal information : Highest level of security in Korea
  • Prompt action to service error : Operated by 24 hrs-management staff
  • Stable service : Highest level of power and equipped prevention facilities of disasters
May 2012 - The following announcement was made on the WIPS Global ADVANCED website:[6]

To improve search results, starting May 7th 2012, we will apply non-stemming method in search English name fields.

As a result you may encounter a difference in number of search results.

Thank you for your understanding and cooperation.

1. Contents: Change of indexing English name fields to non-stemming method

2. Applied fields: English name fields - Inventor, Applicant, Agent, Standardized Applicant, Assignee, Assignor

3. Applied country: US, EP, WO, KPA, PAJ, CN

Country INV AP AG APS ASNO ASNE
US O O O O O O
EP O O O O - -
WO O O O O - -
KPA O O - - - -
PAJ O O - O - -
CN O O - O - -


4. Influence: In case of search formula included English name fields, the number of search results will be expected to decrease than before.

(※Using the truncation (*), same as existing.)

5. e.g.

existing: (david).inv: david, davide, davids - able to search

alternation: (david).inv: david - able to search / davide, davids - unable to search

6. Applied date: Monday May 7th 2012


Use

When signing in to WIPS Global ADVANCED, the user has the option to use a secure connection (SSL). After signing in, the user has access to a number of search forms:

  • Integrated Search - An advanced search form or a step search form are accessible under two different tabs, and users can select from any or all available countries/authorities through both integrated forms. Switching between the two tabs will automatically clear both forms, including all search history for the step form.
    • Advanced Search - Select the country coverage, date range, and enter the search query in either the command line search form or the search fields listed below the command line (all search fields are connected by AND). Users can choose to search in the "Bibliographic+Exemplary Claim" of the record or the full text. Below the search form, available tools include a query matching board (retrieve matching queries from the query folder and query history), error check to identify any errors in the query syntax, a list of available operators, a list of available field abbreviations, and a link to a chart for correctly formatting patent numbers.
    • Step Search - The step search form is identical to the advanced form, except that search result numbers and queries are displayed in a "Step Search List", where each query listed can be combined with other queries in the list. Once the user has selected the country and date coverage for the first search in a step list, they cannot alter the coverage unless they clear the entire list. Individual queries or the full search history can be saved by selecting one or all of the check boxes beside the queries in the step list and then selecting "save queries." Users can create a folder to save the queries in, and up to 100 queries can be saved per folder. A memo can also be added to saved queries.


Step search list for "Integrated Search".


  • Step Search - Like the step search form for the "Integrated Search", except that users can only search under individual country/authority coverage (arranged under seven tabs: US, EP, PCT, JP, KR, CN, DOCDB). Users can also select to only view priority documents under the tabs US, EP, PCT, JP, KR, and CN. Switching between tabs will automatically clear the search history in all forms.


Step search form.


  • Advanced Search - Like the advanced search form for the "Integrated Search", except that users can only search under individual country/authority coverage (arranged under seven tabs: US, EP, PCT, JP, KR, CN, DOCDB). Users can also select to only view priority documents under the tabs US, EP, PCT, JP, KR, and CN. Switching between tabs will automatically clear the search criteria in all forms.


Advanced search form.


  • Number Search - The number search only allows user to search under individual country/authority coverage (arranged under seven tabs: US, EP, PCT, JP, KR, CN, DOCDB). Users can select document type, whether or not to only view priority documents (for US, EP, PCT, JP, KR, and CN), and which document number types to search. The tips for formatting the specific authority's patent numbers are listed directly below the search form. The error check tool is also available for this form. Users can utilize truncation operators in the number query to expand the search.


Number search form.


  • Family Search - The family search form is similar to the advanced search form, except that only six country/authority coverage tabs are available to search under: US, EP, PCT, JP, KR, CN (DOCDB option is missing). An additional set of options is available under each tab, where users can set a range for number of family documents, number of family countries, and select which family country profiles to include via check box (All, US, EP, PCT, JP, KR, CN, Etc). The results list includes the number of families, number of family countries, a graphic representation of which authorities are included in the family, and a link to the family analysis screen for each result.


Family search form.


The family analysis screen includes four tabs:

    • Statistics and List - Customizable charts showing the breakdown of the family based on application year, IPC, applicant, etc. A list of all family members is also available under this tab.
    • Family Country Profiles - A world map with country coverage for the family members visualized.
    • Time Series View - A timeline listing family members by patent date or filing date.
    • Compare Documents - Select two family members and view their bibliographic information, claims, or legal status in two adjacent windows.


Family Analysis Screen (Compare Documents).


  • Citation Search - The citation search allows users to select type of forward citation (All, Citation, Citation from description), forward citation depth (Forward Depth 1, ~ Forward Depth 2), which forward citation profiles to display (All, US, EP, PCT, JP, KR, CN, Etc), and the country and document kind for the specific document number being searched. The system notes that only granted US/EP/JP/KR documents are searchable. Search results include an icon indicating the root document and other icons identifying the citation type (depth, cited by examiner, citation, citation from description). These icons are listed under a "Cited Info" column in the search results, beside a "No. of F1" column and a link to the Citation Analysis screen.


Citation search form.


The citation analysis screen includes a text mode and visual mode for both "Citation" and "Citation from description."

    • Text mode includes a customizable chart of backwards and forwards citations, organized according to selected criteria (applicant, IPC, country). A list of all cited and citing documents is displayed below the chart.
    • Visual mode includes a customizable timeline/depth map that illustrates the relationships between various citations.


Citation Analysis Screen (Visual Mode).


  • Company Search - The search form is similar to the integrated advanced search form (users can select from one or all available authorities to include in the search). Additional criteria that the user can select includes choosing whether to search for a sole application, a joint application, or all types (the user can also enter a range of numbers for the joint application). The user can enter a standardized applicant name, and all standardized applicant codes can be found by selecting "code search."


Code Search window for standardized applicant codes.


Within the Code Search window, the user can search for a company name, select multiple standardized company results, and include these company results in a saved group. Up to three of these groups at a time can be included in a company search (select the group number and all company names in the group to be included in the search). The user can also conduct a search using a single applicant standardized code. All additional search criteria can be entered in the command line form below the applicant criteria. In the search results, an icon indicates whether the document was a sole application or joint application.


Company search form.


A classification code lookup link is accessible in the upper right corner of the screen, and the link will open a window that allows users to search for IPC, UPC, FI/F-term, and ECLA codes. THe FI/F-term definitions can be viewed in English or Japanese.

After conducting a search, queries can be saved individually in folders or registered as SDIs. Users can select a query SDI, a citation SDI, or a Family SDI. The system uses a point system described on the SDI Manager screen:[7]

  • Points will be deducted when an email alerting the weekly updates of your registered SDI is sent.
  • For Search SDI, 100 points will be deducted per case/alert. 10 points for Family SDI and Citation SDI.
  • If you are short on points, it will not be possible to check the updated information.

Each search form allows users to customize the output of the search results, including which fields to display, the format of the list (list/block/drawings), and number of results per page. The search results are displayed directly beneath the search forms (except in the step searches, where the user must select to view each step's result list). Each search result includes a number of options:

  • Select the PDF icon to download a full PDF image of the document.
  • Select the document number or title to open a full record view.
  • Select the Claim icon to open the Claim Analysis screen, which includes three tabs:
    • Claim Tree - View the relationships between the document claims.
    • Claim Keywords - View keywords extracted from each claim.
    • Claim Comparison - View a comparison of two different versions of the claim in adjacent windows with keywords highlighted.


Claim Analysis screen (Claim Tree).


  • Select the Citation icon to open the Citation Analysis screen (described above).
  • Select the Family icon to open the Family Analysis screen (described above).
  • Select the window icon to open the full record in a separate window.

Users can select individual results via the check boxes beside each result in the list. After selecting all relevant documents from the results list, the user can choose:

  • SmartAngle - An analysis tool that analyzes the selected patents based on a variety of chosen criteria. Users can choose the chart analysis (create up to four charts and graphs based on analysis of various fields), cross matrix (select fields for the x and y axis to create a matrix listing the number of patents that meet both sets of criteria for each data field), and classification ("categorize the fields from SmartAngle in more details and group the details in folder tree formation to view the data of the desired field and to conduct filtering").[8]


SmartAngle tool (chart analysis).


  • Easy Viewer - A simple list view of all selected documents, and users can select to view the abstract, representative drawing, and exemplary claim for each document. Users can also define up to three keyword highlighting terms. A "User Classification" section allows users to create and apply tags to the selected documents. Users can view documents in PDF format or in Express View through the Easy Viewer (Express View displays text in one window of the screen and drawing thumbnails in an adjacent window). Finally, users can select documents in the Easy Viewer list to analyze with SmartAngle, add to a folder, or download.


Easy Viewer (add classification tags).


  • My Folder - Save documents to a folder.
  • Download - Download document text (select fields), drawings, and PDF images. Document text can be downloaded in XLS, TXT, MDB, or PMDX (ThinKlear) formats. Downloads cost points, which are deducted from the user's account.

In the full record view, the user can view bibliographic data, description, and claims under three separate tabs. Thumbnail drawings are displayed in a side panel. Users can add custom highlighting to any text under the description and claims tabs. Other options available under the full record view include:

  • Express View of the record.
  • Claim Analysis screen for the record.
  • Citation Analysis screen for the record.
  • Family Analysis screen for the record.
  • Add the record to a folder.
  • Download text, drawings, or a PDF image of the record.
  • View a PDF image of the record.


Full record view.


Finally, users can select from a list of options in the upper right corner of the screen:

  • Search - Return to the main search menu.
  • My Folder - View saved patents (under the Patent Folder tab), view and re-run saved queries (under "Query Folder"), and view previous queries conducted through various search menus (under "Query History").
  • SDI - View your SDI queries and results.
  • My Page - View download history, point usage history, post inquiries to receive answers from a WIPS representative, change your personal information, change the password, or cancel membership.
  • Help - View an index for all sections of the online manual, view a FAQ section, and view the latest news on the system. Phone numbers for the help desk are also available.


Coverage

A data coverage chart for WIPS Global ADVANCED is available on its website, and it lists US, EP, PCT/WO, JP, KR, CN, and INPADOC data coverage:[9]

Data collection Coverage Data Update
frequency
US Patent Application Publications From 2001.03.15 Bibliography, Abstract, Claims, Description, Full-Image, Rep Drawings Every week
Patent Granted Publications From 1976.01.06 Bibliography, Abstract, Claims, Description, Full-Image, Rep Drawings
* Individual Drawings (Pub. date 2001~Present)
Every week
Assignments Information From 1970.01.04 Assignor / Assignee Data
Range of date provided is the registry date of assignee information from the USPTO.
(There could be difference due to newly updated information.)
Every month
EP European Patent Applications From 1978.12.20 Bibliography, Abstract, Claims, Description, Full-Image, Rep Drawings
* Individual Drawings (Pub. date 2000~Present)
Every week
Granted European Patents From 1980.01.09 Bibliography, Abstract, Claims, Description, Full-Image, Rep Drawings
* Individual Drawings (Pub. date 2000~Present)
Every week
PCT(WO) - From 1978.10.19 Bibliography, Abstract, Full-Image, Rep Drawings Every week
JP Patent Application Unexamined Patent Publications From 1993.01.08 Bibliography, Abstract, Claims, Description, Full-Image, Rep Drawings (language Japanese) Every week
1989.01.01-1992.12.31 Full-Image (language Japanese) -
Japanese Translation of PCT International Application From 1996.05.29 Bibliography, Abstract, Claims, Description, Full-Image, Rep Drawings (language Japanese) Every week
Domestic Re-Publication of PCT International Application From 1996.05.29 Bibliography, Abstract, Claims, Description, Full-Image, Rep Drawings (language Japanese) Every week
Examined Patent Publications Examined Patent Publications 1994.01.05-1996.03.29 Bibliography, Abstract, Claims, Description, Full-Image, Rep Drawings (language Japanese) Completed
Granted Patents From 1996.05.29 Bibliography, Abstract, Claims, Description, Full-Image, Rep Drawings (language Japanese) Every week
Utility Application Unexamined Utility Publications 1993.01.08-2009.09.21 Bibliography, Abstract, Claims, Description, Full-Image, Rep Drawings (language Japanese) Every week
1989.01.01-1992.12.31 Full-Image (language Japanese) -
Unexamined Granted Utilities (Published after 1994) From 1994.07.26 Bibliography, Abstract, Claims, Description, Full-Image, Rep Drawings (language Japanese) Every week
Examined Utility Publications Examined Utility Publications 1994.01.05-1996.03.29 Bibliography, Abstract, Claims, Description, Full-Image, Rep Drawings (language Japanese) Completed
Granted Utilities 1996.05.29-2010.06.16 Bibliography, Abstract, Claims, Description, Full-Image, Rep Drawings (language Japanese) Every week
PAJ (Patent Abstract of Japan – Unexamined Applications) 1976.10.01-2011.10.31 Bibliography, Abstract, Claims, Full-Image, Rep Drawings
(English Abstract) (language : English Abstract)
Every month
Amendment Information From 1993.01.08 Amendment Image (PDF) (language Japanese) Every week
KR Patent Application Publications Unexamined Patent Publications From 1983.03.25 Bibliography, Abstract, Claims, Description, Full-Image, Rep Drawings (language : Korean) Every week
Patent Granted Publications Examined Patent Publications 1979.07.12-2009.09.21 Bibliography, Abstract, Claims, Description, Full-Image, Rep Drawings (language : Korean) Completed
Granted Patents From 1998.08.01 Bibliography, Abstract, Claims, Description, Full-Image, Rep Drawings (language : Korean) Every week
Utility Application Publications Unexamined Utility Publications From 1983.03.25 Bibliography, Abstract, Claims, Description, Full-Image, Rep Drawings (language : Korean) Every week
Utility Granted Publications Examined Utility Publications 1979.07.12-2009.09.21 Bibliography, Abstract, Claims, Description, Full-Image, Rep Drawings (language : Korean) Completed
Granted Utilities From 1998.08.01 Bibliography, Abstract, Claims, Description, Full-Image, Rep Drawings (language : Korean) Every week
KPA (Korea Patent Abstract) KPA-A (Unexamined Applications) 2000.01.15-2010.08.23 Bibliography, Abstract (English Abstract) Irregular
KPA-B1 (Examined Applications) 1979.01.01-2010.08.23 Bibliography, Abstract (English Abstract) Irregular
Amendment Information From 2006.05.23 Amendment Image (PDF) Every week
CN Patent Application From 1985.09.10 Bibliography, Abstract, Claims, Description, Full-Image
* PDF Image (Appl. date 1985~2006)
* Text data is offered in Chinese+English depending on its fields.
Every month
Patent Granted From 1985.09.10 Bibliography, Abstract, Claims, Description, Full-Image
* PDF Image (Appl. date 1985~2006)
* Text data is offered in Chinese+English depending on its fields.
Every month
Utility Application From 1985.09.10 Bibliography, Abstract, Claims, Description, Full-Image
* PDF Image (Appl. date 1985~2006)
* Text data is offered in Chinese+English depending on its fields.
Every month
Utility Granted From 1985.09.10 Bibliography, Abstract, Claims, Description, Full-Image
* PDF Image (Appl. date 1985~2006)
* Text data is offered in Chinese+English depending on its fields.
Every month
DOCDB From 1968.01.01 Bibliography, Abstract, Legal Status (English Abstract) Every week

Standardized Applicant

2010.03.11For individual/corporate applicants that filed for over 50 applications in DOCDBIrregular

KR standardized Applicant

2010.06.04For Korean corporate applicants that filed for over 50 domestic patent/utility applicationsIrregular

The data is updated every Monday. It should be noted that lag time may occur between publication of the document and upload of the document data to WIPS Global ADVANCED.

The website also gives the following information about the CN data:[9]

  • Unlike other countries' data, CN data's supply is somewhat unstable and can be lower in quality.
  • CN data has a unique sequential data processing, which in some cases cannot offer all fields at once but updates them sequentially.
  • WIPS will upload the sequentially supplied data into our database periodically, so there is a chance that fields may be changed over time.
  • English translated(Machine and Human) Titles and Abstracts will be provided in order following the Chinese data.
  • Due to the sequential data processing, certain files cannot offer Chinese/English Machine Translation/English Human Translation at the same time.


Access

Two subscription types are available for WIPS Global ADVANCED:[10]

  • Single - Monthly or yearly subscriptions are available, and this this service can be used anywhere freely. This subscription doesn't allow concurrent use with the same ID.
  • Pro - Yearly subscription available, and this service is available for a specified IP environment. This subscription doesn't allow concurrent use with the same ID.

A free trial is also available for WIPS Global ADVANCED.[10]

Download and SDI services appear to cost extra.[11]


Sources

  1. "February 1, 2012, WIPS Global ADVANCED, the new service of WIPS has born!" WIPS Global website, http://www.wipsglobal.com/WG_Search/notice/wga_service_20120201.htm. Accessed February 2, 2012.
  2. "Service Introduction & Benefits." WIPS Global ADVANCED website, http://adv.wipsglobal.com/VB0000/. Accessed February 2, 2012.
  3. 3.0 3.1 "News & Notices." WIPS Global ADVANCED website, http://adv.wipsglobal.com/VD0000/. Accessed January 9, 2013.
  4. "Data Coverage." WIPS Global ADVANCED website, http://adv.wipsglobal.com/VC0200/. Accessed January 9, 2013.
  5. "[Service Interruption] Transfer of IP servers to new Internet Data Center (IDC)." WIPS Global website, http://www.wipsglobal.com/. Accessed August 17, 2012.
  6. "Notice: 'Change of indexing English name fields to non-stemming method.' WIPS Global ADVANCED website, http://adv.wipsglobal.com/VD0001/ (restricted). Accessed May 8, 2012.
  7. "SDI." WIPS Global ADVANCED website, http://adv.wipsglobal.com/JA0200/ (restricted). Accessed February 7, 2012.
  8. "User Manual: SmartAngle." WIPS Global Advanced Help Center, http://adv.wipsglobal.com/VC0017/ (restricted). Accessed February 7, 2012.
  9. 9.0 9.1 "Data Coverage." WIPS Global Advanced Help Center, http://adv.wipsglobal.com/VC0200/. Accessed February 3, 2012.
  10. 10.0 10.1 "Membership Type." WIPS Global Advanced Help Center, http://adv.wipsglobal.com/VB0100/. Accessed February 3, 2012.
  11. "User Fee." WIPS Global Advanced Help Center, http://adv.wipsglobal.com/VB0200/. Accessed February 3, 2012.

Patent search questions. Expert answers.  Brought to you by Landon IP
HOT Items

Intellogist is brought to you by the patent search experts at Landon IP.

Welcome to Intellogist!

To network with our international community of patent info pros, please create an account.

For a list of our current members, see our Community Page.